ADVANCES IN ELECTRONIC TESTING CHALLENGES AND METHODOLOGIES
Language: ENGLISH Publication details: SPRINGER 2006Description: 412ISBN: 9780387294087Subject(s): ELECTRONIC TESTING AND MEASURING COMPONENTS (DEVICES) [Electronic Instruments and Measurements, Signals, Sweep, Square-Wave , Generators, Thermistors, Oscillographs, Indicators, Gauges, Meters]DDC classification: 621.381548 P6 GIZItem type | Current library | Call number | Materials specified | Status | Notes | Date due | Barcode |
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Reference | Central Library, PSG Institute of Technology and Applied Research | 621.381548 P6 GIZ (Browse shelf(Opens below)) | Available | ELECTRONICS AND COMMUNICATION | 16414 |
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621.38132 P4 LEE PLANAR MICROWAVE ENGINEERING | 621.3815 N7 TUM MICROELECTRONICS PACKAGING HAND BOOK TECHNOLOGY DRIVERS PART - I | 621.3815 P3 GRE BIPOLAR AND MOS ANALOG INTEGRATED CIRCUIT DESIGN | 621.381548 P6 GIZ ADVANCES IN ELECTRONIC TESTING CHALLENGES AND METHODOLOGIES | 621.382 P0 NEE OFDM FOR WIRELESS MULTIMEDIA COMMUNICATIONS | 621.38224 P5 KAI ELECTROMAGNETIC COMPATIBILITY HANDBOOKOK | 621.38224 P5 KAI ELECTROMAGNETIC COMPATIBILITY HANDBOOKOK |
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