Analog and Mixed-Signal test
Language: English Publication details: Prentice hall 1998Description: 261 Hard BoundISBN: 9780137863105Subject(s): Electronic CircuitsDDC classification: 621.3815 N8 VIN![](/opac-tmpl/bootstrap/itemtypeimg/vokal/Book.png)
Item type | Current library | Call number | Materials specified | Status | Notes | Date due | Barcode |
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Central Library, PSG Institute of Technology and Applied Research | 621.3815 N8 VIN (Browse shelf(Opens below)) | Available | ECE | 24321 |
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621.38132 P4 LEE PLANAR MICROWAVE ENGINEERING | 621.38132 P4 LEE PLANAR MICROWAVE ENGINEERING | 621.3815 N7 TUM MICROELECTRONICS PACKAGING HAND BOOK TECHNOLOGY DRIVERS PART - I | 621.3815 N8 VIN Analog and Mixed-Signal test | 621.3815 P3 GRE BIPOLAR AND MOS ANALOG INTEGRATED CIRCUIT DESIGN | 621.381548 P6 GIZ ADVANCES IN ELECTRONIC TESTING CHALLENGES AND METHODOLOGIES | 621.382 P0 NEE OFDM FOR WIRELESS MULTIMEDIA COMMUNICATIONS |
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