000 00442nam a2200133Ia 4500
008 211112s9999 xx 000 0 und d
020 _a9781441909282
041 _aEnglish
100 _aPatrick Girard, Nicola Nicolici, Xiaoqing Wen
245 0 _aPower-Aware Testing and Test Strategies for Low Power Devices
260 _c2010
_bSpringer eBooks
856 _uhttp://link.springer.com/openurl?genre=book&isbn=978-1-4419-0928-2
942 _cEB
999 _c22170
_d22170